Equipment |
High-resolution Scanning TEM (JEOL JEM 2100) |
Scanning TEM (JEOL 2000FX2) |
X-ray Diffractometer (Bruker D8A,D2) |
Small angle X-ray Diffractometer (NANO-Viewer) |
Dimpler (South Bay Technology Model 515) |
Ion-Mill (Gatan Model 600) |
X-Ray Photoelectron Spectrometer (VG Sigma Probe) |
TGA;DSC(Perkin Elmer TGA-7)、(Diamond DSC) 、(Mettler DSC) 、(Netzsch HTDSC/TG) |
Surface Area and Porosity analyzer (Micromeritics ASAP2010, ASAP2020) |
Particle-size Analyzer (ZEN 4003) |
Field-emission SEM (FEI NOVA 230) 、(Hitachi S800) 、(FEI Inspect F50) |
Focus Ion Beam (FEI Versa 3D) |
Low-vacuum SEM (Hitachi 3500N) |
Raman Spectrometer (Uni RAM) |